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 KM62256C Family
Document Title
32Kx8 bit Low Power CMOS Static RAM
CMOS SRAM
Revision History
Revision No
0.0 0.1 1.0 2.0
History
Advance information Initial draft Finalize Revise - Add 45ns part with 30pF test load Revise - Change specification format and merge : Commercial, Extended, Industrial product in same datasheets. Revise - Change Speed bin Erase 45ns part from commercial product and 100ns from extended and industrial product. - Production change Erase Low power product from TSOP package
Draft Data
February 12th 1993 November 2nd 1993 September 24th 1994 August 12th 1995
Remark
Design target Preliminary Final Final
3.0
April 15th 1996
Final
4.0
December 19 1997
Final
The attached datasheets are prepared and approved by SAMSUNG Electronics. SAMSUNG Electronics CO., LTD. reserve the right to change the specifications and product. SAMSUNG Electronics will evaluate and reply to your requests and questions about device. If you have any questions, please contact the SAMSUNG branch office near your office, call or contact Headquarters.
1
Revision 4.0 December 1997
KM62256C Family
32Kx8 bit Low Power CMOS Static RAM
FEATURES
* Process Technology : 0.7m CMOS * Organization : 32Kx8 * Power Supply Voltage : Single 5V10% * Low Data Retention Voltage : 2V(Min) * Three state output and TTL Compatible * Package Type : 28-DIP-600, 28-SOP-450, 28-TSOP1 -0813.4F/R
CMOS SRAM
GENERAL DESCRIPTION
The KM62256C family is fabricated by SAMSUNGs advanced CMOS process technology. The family supports various operating temperature ranges and has various package types for user flexibility of system design. The family also support low data retention voltage for battery back-up operation with low data retention current.
PRODUCT FAMILY
Power Dissipation Product Family KM62256CL KM62256CL-L KM62256CLE KM62256CLE-L KM62256CLI KM62256CLI-L Industrial (-40~85C) 70ns Extended (-25~85C) 70ns Operating Temperature. Speed(ns) PKG Type Standby (ISB1, Max) 100A 20A 100A 50A 100A 50A 70mA Operating (Icc2)
Commercial (0~70C)
55/70ns
28-DIP, 28-SOP 28-TSOP I R/F 28-SOP 28-TSOP I R/F 28-SOP 28-TSOP I R/F
PIN DESCRIPTION
OE A11 A9 A8 A13 WE VCC A14 A12 A7 A6 A5 A4 A3 A3 A4 A5 A6 A7 A12 A14 VCC WE A13 A8 A9 A11 OE 1 2 3 4 5 6 7 8 9 10 11 12 13 14 14 13 12 11 10 9 8 7 6 5 4 3 2 1 28 27 26 25 24 23 22 21 20 19 18 17 16 15 15 16 17 18 19 20 21 22 23 24 25 26 27 28 A10 CS I/O8 I/O7 I/O6 I/O5 I/O4 VSS I/O3 I/O2 I/O1 A0 A1 A2 A2 A1 A0 I/O1 I/O2 I/O3 VSS I/O4 I/O5 I/O6 I/O7 I/O8 CS A10
FUNCTIONAL BLOCK DIAGRAM
Clk gen. Precharge circuit.
A14 A12 A7 A6 A5 A4 A3 A2 A1 A0 I/O1 I/O2 I/O3 VSS
1 2 3 4 5 6 7 8 9 10 11 12 13 14
28 27 26 25 24 23
VCC WE A13 A8 A9 A11 OE A10 CS I/O8 I/O7 I/O6 I/O5 I/O4
28-TSOP Type I - Forward
A3 A4 A5 A6 A7 A8 A12 A13 A14
Row select
28-DIP 22 28-SOP 21
20 19 18 17 16 15
Memory array 512 rows 64x8 columns
28-TSOP Type I - Reverse
I/O1 I/O8
Data cont
I/O Circuit Column select
Data cont
NameName
A0~A14 WE CS OE I/O1~I/O8 Vcc Vss
Function
Address Inputs Write Enable Input Chip Select Input Output Enable Input Data Inputs/Outputs Power(5V) Ground
CS WE OE A0 A1 A2 A9 A10 A11
Control Logic
SAMSUNG ELECTRONICS CO., LTD. reserves the right to change products and specifications without notice.
2
Revision 4.0 December 1997
KM62256C Family
PRODUCT LIST
Commercial Temp Product (0~70C) Part Name
KM62256CLP-5 KM62256CLP-5L KM62256CLP-7 KM62256CLP-7L KM62256CLG-5 KM62256CLG-5L KM62256CLG-7 KM62256CLG-7L KM62256CLTG-5L KM62256CLTG-7L KM62256CLRG-5L KM62256CLRG-7L
CMOS SRAM
Extended Temp Products (-25~85C) Part Name Function
28-SOP, 70ns, L-pwr 28-SOP, 70ns, LL-pwr 28-TSOP F, 70ns, LL-pwr 28-TSOP R, 70ns, LL-pwr
Industrial Temp Products (-40~85C) Part Name
KM62256CLGI-7 KM62256CLGI-7L KM62256CLTGI-7L KM62256CLRGI-7L
Function
Function
28-SOP, 70ns, L-pwr 28-SOP, 70ns, LL-pwr 28-TSOP F, 70ns, LL-pwr 28-TSOP R, 70ns, LL-pwr
KM62256CLGE-7 28-DIP, 55ns, L-pwr KM62256CLGE-7L 28-DIP, 55ns, LL-pwr KM62256CLTGE-7L 28-DIP, 70ns, L-pwr KM62256CLRGE-7L 28-DIP, 70ns, LL-pwr 28-SOP, 55ns, L-pwr 28-SOP, 55ns, LL-pwr 28-SOP, 70ns, L-pwr 28-SOP, 70ns, LL-pwr 28-TSOP F, 55ns, LL-pwr 28-TSOP F, 70ns, LL-pwr 28-TSOP R, 55ns, LL-pwr 28-TSOP R, 70ns, LL-pwr
Note : LL means Low Low standby current.
FUNCTIONAL DESCRIPTION
CS H L L L
1. X means dont care
OE X H L X
WE X H H L
I/O Pin High-Z High-Z Dout Din
Mode Deselected Output Disabled Read Write
Power Standby Active Active Active
ABSOLUTE MAXIMUM RATINGS
Item Voltage on any pin relative to Vss Voltage on Vcc supply relative to Vss Power Dissipation Storage temperature
1)
Symbol VIN,VOUT VCC PD TSTG
Ratings -0.5 to VCC+0.5 -0.5 to 7.0 1.0 -65 to 150 0 to 70
Unit V V W C C C C -
Remark KM62256CL KM62256CLE KM62256CLI -
Operating Temperature
TA
-25 to 85 -40 to 85
Soldering temperature and time
TSOLDER
260C, 10sec(Lead Only)
1. Stresses greater than those listed under "Absolute Maximum Ratings" may cause permanent damage to the device. Functional oper ation should be restricted to recommended operating condition. Exposure to absolute maximum rating conditions for extended periods may affect d vice reliability. e
3
Revision 4.0 December 1997
KM62256C Family
RECOMMENDED DC OPERATING CONDITIONS
Item Supply voltage Ground Input high voltage Input low voltage Symbol Vcc Vss VIH VIL Min 4.5 0 2.2 -0.5
3)
CMOS SRAM
1)
Typ 5.0 0 -
Max 5.5 0 Vcc+0.5V 0.8
2)
Unit V V V V
Note 1. Commercial Product : TA=0 to 70C, unless otherwise specified Extended Product : TA=-25 to 85C, unless otherwise specified Industrial Product : TA=-40 to 85C, unless otherwise specified 2. Overshoot : VCC+3.0V in case of pulse width30ns 3. Undershoot : -3.0V in case of pulse width30ns 4. Overshoot and undershoot is sampled, not 100% tested
CAPACITANCE 1) (f=1MHz, TA=25C)
Item Input capacitance Input/Output capacitance
1. Capacitance is sampled, not 100% tested
Symbol CIN CIO
Test Condition VIN=0V VIO=0V
Min -
Max 6 8
Unit pF pF
DC AND OPERATING CHARACTERISTICS
Item Input leakage current Output leakage current Operating power supply current Average operating current Symbol ILI ILO ICC ICC1 ICC2 Output low voltage Output high voltage Standby Current(TTL) KM62256CL KM62256CL-L Standby Current (CMOS) KM62256CLE KM62256CLE-L KM62256CLI KM62256CLI-L
1. 20mA for Extended and Industrial Products 2. 10mA for Extended and Industrial Products 3. 2mA for Extended and Industrial Products
Test Conditions VIN=Vss to Vcc CS=VIH or WE=VIL, VIO=Vss to Vcc IIO=0mA, CS=VIL, VIN=VIH or VIL Cycle time=1s, 100% duty, IIO=0mA CS0.2V, VIN0.2V, VINVcc -0.2V
Cycle time=Min,100% duty, IIO=0mA, CS=VIL, VIN=VIH or VIL
Min -1 -1 2.4 L(Low Power) LL(L Low Power) -
Typ 7 2 1 -
Max 1 1 15
1)
Unit A A mA mA mA V V mA A A A
72) 70 0.4 13) 100 20 100 50 100 50
VOL VOH ISB
IOL=2.1mA IOH=-1.0mA CS=VIH, Other inputs=VIH or VIL
ISB1
CSVcc-0.2V, Other inputs=0~Vcc
L(Low Power) LL(L Low Power) L(Low Power) LL(L Low Power)
4
Revision 4.0 December 1997
KM62256C Family
AC OPERATING CONDITIONS
TEST CONDITIONS (Test Load and Test Input/Output Reference)
Input pulse level : 0.8 to 2.4V Input rising and falingl time : 5ns input and output reference voltage : 1.5V Output load (See right) :CL=100pF+1TTL
CMOS SRAM
CL1)
1. Including scope and jig capacitance
AC CHARACTERISTICS(Vcc=4.5~5.5V, KM62256C Family : TA=0 to 70C, KM62256CE Family : TA=-25 to 85C,
KM62256CI Family : TA=-40 to 85C) Speed Bins Parameter List Symbol Min Read cycle time Address access time Chip select to output Output enable to valid output Read Chip select to low-Z output Output enable to low-Z output Chip disable to high-Z output Output disable to high-Z output Output hold from address change Write cycle time Chip select to end of write Address set-up time Address valid to end of write Write Write pulse width Write recovery time Write to output high-Z Data to write time overlap Data hold from write time End write to output low-Z tRC tAA tCO tOE tLZ tOLZ tHZ tOHZ tOH tWC tCW tAS tAW tWP tWR tWHZ tDW tDH tOW 55 10 5 0 0 5 55 45 0 45 40 0 0 25 0 5 55ns Max 55 55 25 20 20 20 Min 70 10 5 0 0 5 70 60 0 60 50 0 0 30 0 5 70ns Max 70 70 35 30 30 25 ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns Units
DATA RETENTION CHARACTERISTICS
Item Vcc for data retention VDR KM62256CL KM62256CL-L Data retention current IDR KM62256CLE KM62256CLE-L KM62256CLI KM62256CLI-L Data retention set-up time Recovery time tSDR tRDR Vcc=3.0V CSVcc-0.2V Symbol Test Condition CSVcc-0.2V L-Ver LL-Ver L-Ver LL-Ver L-Ver LL-Ver See data retention waveform Min 2.0 0 5 Typ 1 0.5 Max 5.5 50 10 50 25 50 25 ms A Unit V
5
Revision 4.0 December 1997
KM62256C Family
TIMMING DIAGRAMS
TIMING WAVEFORM OF READ CYCLE(1)
Address tOH Data Out Previous Data Valid tAA
(Address Controlled, CS=OE=VIL, WE=VIH)
CMOS SRAM
tRC
Data Valid
TIMING WAVEFORM OF READ CYCLE(2)
(WE=VIH)
tRC Address tAA tCO CS tOE OE tOLZ tLZ Data Valid tOHZ tHZ tOH
Data out
NOTES (READ CYCLE)
High-Z
1. tHZ and tOHZ are defined as the time at which the outputs achieve the open circuit conditions and are not referenced to output voltage levels. 2. At any given temperature and voltage condition, tHZ(Max.) is less than tLZ(Min.) both for a given device and from device to device interconnection.
6
Revision 4.0 December 1997
KM62256C Family
TIMING WAVEFORM OF WRITE CYCLE(1)
(WE Controlled)
CMOS SRAM
tWC Address tCW(2) CS tAW tWP(1) WE tAS(3) Data in tWHZ Data out Data Undefined tDW Data Valid tOW tDH tWR(4)
TIMING WAVEFORM OF WRITE CYCLE(2)
(CS Controlled)
tWC Address tAS(3) CS tAW tWP(1) WE tDW Data in Data Valid tDH tCW(2) tWR(4)
Data out
NOTES (WRITE CYCLE)
High-Z
High-Z
1. A write occurs during the overlap of a low CS and a low WE. A write begins at the latest transition among CS going Low and WE going low : A write end at the earliest transition among CS going high and WE going high, tWP is measured from the begining of write to the end of write. 2. tCW is measured from the CS going low to end of write. 3. tAS is measured from the address valid to the beginning of write. 4. tWR is measured from the end of write to the address change. t R applied in case a write ends as CS or WE going high. W
DATA RETENTION WAVE FORM
CS controlled
VCC 4.5V tSDR Data Retention Mode tRDR
2.2V VDR CSVCC - 0.2V
CS GND
7
Revision 4.0 December 1997
KM62256C Family
PACKAGE DIMENSIONS
28 PIN DUAL INLINE PACKAGE(600mil)
CMOS SRAM
Units :millimeters(inches)
+0.10 -0.05 0.010+0.004 -0.002
0.25
#28
#15
#1 36.72 MAX 1.446 36.320.20 1.4300.008
#14 0~15 3.810.20 0.1500.008 5.08 0.200 MAX
( 1.65 ) 0.065
0.460.10 0.0180.004 1.520.10 0.0600.004
2.54 0.100
0.38 0.015 MIN
28 PIN PLASTIC SMALL OUTLINE PACKAGE(450mil)
0~8 #28 #15
15.24 0.600 3.300.30 0.1300.012
13.600.20 0.5350.008
11.810.30 0.4650.012
8.380.20 0.3300.008
#1 18.69 0.736 MAX 18.290.20 0.7200.008
#14 2.590.20 0.1020.008 3.00 0.118MAX
11.43 0.450
0.15
+0.10 -0.05 0.006+0.004 -0.002
1.020.20 0.0400.008
0.10 MAX 0.004 MAX
(
0.89 ) 0.035
0.410.10 0.0160.004
1.27 0.050
0.05 MIN 0.002
8
Revision 4.0 December 1997
KM62256C Family
PACKAGE DIMENSIONS
28 PIN THIN SMALL OUTLINE PACKAGE TYPE I (0813.4F)
CMOS SRAM
Units :millimeters(inches )
+0.10 -0.05 +0.004 0.008-0.002
0.20
13.400.20 0.5280.008 #28 ( 8.40 0.331 MAX 8.00 0.315 0.425 ) 0.017
#1
0.55 0.0217
#14
#15 1.000.10 0.0390.004 1.20 0.047MAX 0.05 0.002 MIN
28 PIN THIN SMALL OUTLINE PACKAGE TYPE I (0813.4R)
0.10 MAX 0.004 MAX
+0.10 -0.05 +0.004 0.008-0.002
0.20
13.400.20 0.5280.008 #15 ( 8.40 0.331 MAX 8.00 0.315 0.425 ) 0.017
#14
0.55 0.0217
#1 0.25 0.010 TYP 11.800.10 0.4650.004
#28
+0.10 -0.05 0.006+0.004 -0.002
0.15
1.000.10 0.0390.004 1.20 0.047 MAX
0~8
0.45 ~0.75 0.018 ~0.030
(
0.50 ) 0.020
9
0.10 MAX 0.004 MAX 0.05 0.002 MIN
Revision 4.0 December 1997


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